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| Journal of Measurement Science and Technology | |
|---|---|
| Title | Journal of Measurement Science and Technology |
| Discipline | Metrology |
| Abbreviation | J. Meas. Sci. Technol. |
| Publisher | Institute of Physics Publishing |
| History | 1984–present |
| Frequency | Monthly |
Journal of Measurement Science and Technology is a peer-reviewed scientific journal covering metrology and measurement science published by the Institute of Physics Publishing. It reports original research, review articles, and technical notes on instrumentation, sensors, standards, calibration, and measurement techniques. The journal serves as a venue for work connecting industrial laboratories, national metrology institutes, and academic groups.
The journal was established in the context of the evolving metrology community during the late 20th century, a period that included activity at National Physical Laboratory (United Kingdom), National Institute of Standards and Technology, International Bureau of Weights and Measures, and collaborations among University of Cambridge, Massachusetts Institute of Technology, Imperial College London, University of Oxford, Delft University of Technology, ETH Zurich, Tokyo Institute of Technology, and Tsinghua University. Early editors and contributors had ties to organizations such as International Organization for Standardization, European Commission, National Research Council (Canada), Fraunhofer Society, and Japan Society for the Promotion of Science. The journal’s formation parallels milestones including the redefinition efforts led by Bureau International des Poids et Mesures delegates, advances reported at conferences like the International Congress of Metrology, and initiatives associated with laboratories such as Physikalisch-Technische Bundesanstalt and Laboratoire National de Métrologie et d'Essais.
The journal publishes work on sensor development reported by groups at SRI International, NASA, CERN, and Argonne National Laboratory; studies on uncertainty analysis linked to researchers from National Institute of Standards and Technology, National Physical Laboratory (United Kingdom), and European Space Agency; and papers on traceability referencing practice at Bureau International des Poids et Mesures, International Organization for Standardization, and International Electrotechnical Commission. Common topics include precision instrumentation from teams at Stanford University, California Institute of Technology, and Johns Hopkins University; optical metrology associated with Max Planck Society, Rutherford Appleton Laboratory, and Lawrence Berkeley National Laboratory; electrical measurements involving IEEE committees and standards from International Electrotechnical Commission; and micro- and nano-measurements connected to National Institute for Materials Science and Korea Advanced Institute of Science and Technology.
Editorial leadership has historically involved academics and practitioners from University of Manchester, University of Tokyo, École Polytechnique Fédérale de Lausanne, University of California, Berkeley, and Seoul National University. The editorial board typically includes section editors and associate editors drawn from Massachusetts Institute of Technology, University of Illinois Urbana-Champaign, University of Sydney, University of Toronto, and Hong Kong University of Science and Technology. Peer review follows standard procedures used across journals published by Institute of Physics Publishing and mirrors practices discussed in venues such as Committee on Publication Ethics consultations and workshops at conferences like the SPIE Optics + Photonics meeting and the American Physical Society gatherings. Review cycles, conflict-of-interest disclosures, and editorial decisions align with guidelines shaped by organizations including Council of Science Editors.
The journal is indexed in major databases and citation services comparable to those used by research libraries including collections curated by Clarivate, Scopus (Elsevier), and subject indexes used by CAS, INSPEC, and PubMed Central where applicable. Abstracting and indexing practices reference standards and metrics produced by Web of Science Group and Elsevier analytics, and visibility is enhanced through aggregation services operated by institutions such as Google Scholar and library systems of The British Library and Library of Congress.
Published by Institute of Physics Publishing, the journal issues monthly volumes and publishes articles in English with formats consistent with other titles from the publisher, paralleling policies at journals overseen by organizations like American Institute of Physics. Access models have included subscription-based access used by university consortia such as those at University of California and hybrid open-access options compatible with funding mandates from agencies like European Research Council, UK Research and Innovation, National Science Foundation (United States), and Japan Society for the Promotion of Science. Archiving and long-term preservation practices coordinate with repositories and initiatives such as Portico and national library programs at British Library and Bibliothèque nationale de France.
The journal’s influence is reflected in citation patterns comparable to specialist titles read by researchers at National Physical Laboratory (United Kingdom), Physikalisch-Technische Bundesanstalt, National Institute of Standards and Technology, and university departments at University of Cambridge and Stanford University. Authors from institutions such as Queen Mary University of London, University of Melbourne, University of São Paulo, Indian Institute of Science, and Peking University contribute to its corpus. The title is referenced in policy and standards discussions involving International Organization for Standardization, International Bureau of Weights and Measures, and technical committees within IEEE, and it is cited in proceedings of meetings like IEEE Instrumentation and Measurement Technology Conference and Metrologia-affiliated symposia.
Category:Metrology journals